Advanced Computing in Electron Microscopy by Earl J. Kirkland

By Earl J. Kirkland

Preface to moment version a number of new issues were additional, a few small mistakes were corrected and a few new references were extra during this variation. New subject matters contain aberration corrected tools, scanning confocal mode of operations, Bloch wave eigenvalue equipment and parallel computing ideas. The ?rst version - cluded a CD with machine courses, which isn't incorporated during this variation. - stead the linked courses could be to be had on an linked site (currently˜kirkland,but may perhaps flow as time is going on). I desire to thank Mick Thomas for getting ready the specimen used to list the picture in Fig.5.26 and to thank Stephen P. Meisburger for suggesting an attractive organic specimen to take advantage of in Fig.7.24. back, I make an apology prematurely for leaving out a few undoubtedlyoutstanding r- erences. I additionally make an apology for the as but undiscovered mistakes that stay within the textual content. Earl J. Kirkland, December 2009 Preface to First variation snapshot simulation has turn into a typical device in HREM (High answer El- tron Microscopy) in recent times. even though, the literature at the topic is scattered between many alternative journals and convention complaints that experience happened within the final or 3 many years. it truly is dif?cult for rookies to start during this ?eld.

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9: The STEM probe intensity (approximate point spread function) when astigmatism is negligible versus normalized radius R = r(CsA3)-1/4 for various values of the normalized defocus D = /:If(C s A)-1/2 and objective aperture Kmax = kmax(CsA3)1/4. 5 The transfer function is just the inverse Fourier transform of the point spread function. 10. It is difficult to define an optimum defocus and aperture to produce the best probe for the highest resolution. 9a), however the tails are dramatically increased in size.

The supercell does not have to be square and there may be a different number of pixels in x and y although this is usually less efficient. , a tall narrow supercell in real space becomes short and wide in reciprocal space). 5) This is referred to as the Nyquist limit. , to avoid sampling artifacts in the image). y is too large then the signal is under sampled and aliasing occurs. 3 shows the effect of under sampling a sine wave. The high frequency sine wave appears to be a low frequency sine wave if it is under sampled.

Singelton, 'Algorithm 345, An ALGOL Convolution Procedure Based on the Fast Fourier Transform', Comm. 9. AN FFT SUBROUTINE IN FORTRAN C (see especially routine FFT4) C C F C W C N complex array of input data, will be replaced by its FFT complex scratch array to hold look up table of sin/cos length of F and W (N= 2**LN ). N MUST be a power of 2 C SUBROUTINE FFT842( F, N ) IMPLICIT NONE INTEGER N COMPLEX F(N) INTEGER KO, Kl, K2, K3, KINC, KINC2, I, J, K, Nl + COMPLEX WO, Wl, W2, W3 COMPLEX F02A, F02B, F13A, F13B REAL TPI, Xl C C the following var.

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